Trace Element Analysis of Geological Materials

Method X-ray fluorescence (XRF) spectrometry A large number of trace elements at concentrations as low as 0.5 mg/kg can be determined in a wide range of sample types. Sample preparation Samples received for XRF trace-element analysis are dried at 110° C and where necessary are finely ground in a tungsten carbide ring mill. Boric acid backed discs of ground material are prepared under high pressure and analysed under vacuum.

Nineteen trace elements are available for analysis in geological materials on a routine basis, and a further twenty-four are determinable non-routinely. To view a layout of these elements, click here.

Quality assurance

Calibration of the spectrometer for the measurement of rocks and soils is carried out using international reference standards of appropriate compositional range for each element of interest in accordance with the requirements of International Accreditation New Zealand - ISO 17025.